Description
The GUT-6000B is a desktop digital IC tester. Oriented toward automating testing tasks, the GUT-6000B
contains high-end features such as auto-search and loop testing. Automated processes provide an
intelligent and continuous process for detecting defective ICs. Self-diagnosis functions and over-load
protection mechanisms make the GUT-6000B close to maintenance-free, releasing users from
unnecessary hassles. The wide device coverage includes the 1800 series as well as the ubiquitous TTL
and CMOS, providing a one-size fits-all solution for an IC testing bench area.
GUT-6000B | |
TEST RANGE | TTL 74/54
CMOS 40/45 DRIVE |
TEST VOLTAGE | |
2.5/3.0/3.3/5V | |
TEST TIME | |
Average Search Time : 0.6Sec | |
DISPLAY | |
16Characters in 1 line LCD | |
POWER SOURCE | |
AC100V~240V±10%,50/60Hz | |
DIMENSIONS & WEIGHT | |
335(W) ×105(H) ×300(D)mm, Approx. 1.5kg |